Trouble error parameters determination microrelief optoelectronic means on the basis of correlation algorithm

Abstract

In this article the method of compensation of auxillary measurement error by means of optical and electronic complex of the parameters of surface microrelief which appears as a result of the deflection of the light flux level from its nominal meaning is viewed. The method is based on the determination of autocorrelative functions by the image of analyzed surface.

About the authors

A. D. Abramov

Samara State Technical University

Author for correspondence.
Email: Esib@Samgtu.ru

Candidate of Sciences (Engineering)

Associate Professor of the Department of Electronic Systems and Information Security

Japan

F. F. Bukanov

Samara State Technical University

Email: Esib@Samgtu.ru

Candidate of Sciences (Engineering)

Head of Department of Electronic Systems and Information Secu-rity

Russian Federation

References

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  2. Assigning, marking and control parameters of surface roughness of machine parts. Textbook. manual for schools. M.: MGIU, 2010. 111 р.
  3. Abramov A.D. Determination of surface micro-geometry of machinery parts based on computer processing of their videos. Herald of computer and information technologies. Number 11, 2008. P. 18-25.(In Russ.)
  4. Shabaldin E.D., Smolin G.K., Utkin V.P., Zarubin AP Metrology or electrical measurements. Textbook. manual for schools. Yekaterinburg. Publ HPE "Ros. Reg. Prof.-ped. Univ ", 2006. 282 р.
  5. Baskakov SI Radio Circuits and Signals. Moscow: Higher School, 2003. 462 p.
  6. Dadzhion D., Mersereau R. Digital processing of multidimensional signals. Wiley, New York, 1988. 488 p.

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