Device for rejection of semiconductor diodes

Abstract


The article describes the control device, allowing to make rejection of semiconductor diodes. The proposed device has a high accuracy and reliability of the control. The device allows you to set different rates of change of the out-put voltage of the sawtooth generator. Quality control is performed by diode reverse branch of the current-voltage characteristics. The device provides a better signal / noise ratio at low current levels.


About the authors

S. V. Tyulevin

Samara State Aerospace University

Email: kipres@ssau.ru

Russian Federation

Candidate of Sciences (Engineering)

Assistant Professor of the Department of Design and Technology of Electronic Systems and Devices

M. N. Piganov

Samara State Aerospace University

Author for correspondence.
Email: piganov@ssau.ru

Russian Federation

Doctor of Sciences (Engineering), Professor

Professor of the Department of Design and Technology of Electronic Systems and Devices.

G. P. Chopin

Samara State Aerospace University

Email: mirtea@ya.ru

Russian Federation

Candidate of Sciences (Engineering)

Associate Professor of the Department of Design and Technology of Electronic Systems and Devices

A. I. Arhipov

Samara State Aerospace University

Email: kipres@ssau.ru

Russian Federation

Postgraduate Student, Department of Design and Technology of Electronic Systems and Devices

References

  1. Tyulevin S.V., Arhipov A.I., Piganov M.N., Elizarov S.V.
  2. Analysis of the effectiveness of predictive models for quality parameters chips // West nickname Samara State Aerospace University named after S.P. Korolev (national research university). 2011. № 7 (31). Р. 58-63. (In Russ.)
  3. Shumskikh I.Y., Tyulevin S.V., Piganov M.N. Predicted mathematical models of quality printed circuit assemblies for Space apparatus // Proceedings of Samara Scientific Center of the Russian Academy of Sciences. 2011. T. 13.
  4. № 4 (4).
  5. Р. 1127-1133. (In Russ.)
  6. Piganov M.N. Individual forecasting indicators of quality elements and components microassemblages. M.: New Technologies, 2002. 267 p.
  7. Piganov M.N., Tyulevin S.V. Reliability prediction of electronic equipment // Scientific and technical statements STU. Computer. Telecommunications. Management. 2009. № 1 (72). P. 174-180. (In Russ.)
  8. Tyulevin S.V., Piganov M.N. Structural model of individual projections of space equipment // Bulletin of the Samara State Aerospace university. 2008. № 1. P.92-96. (In Russ.)
  9. Andreeva V.V., Piganov M.N., Royuk V.N., Skomorohov G.Y.
  10. Individual forecasting stability precision thin-film capacitors based on aluminum-neodymium Minata // Electronic Engineering. Ser. "Quality management, standardization, metrology,-Test-". 1980. Issue 4. Р. 10-12. (In Russ.)
  11. Tyulevin S.V., Kozlova I.N. Selecting methods of forecasting individual quality indicators RES based on expert judgment // Modern directions of theoretical and applied research - 2009: National. Nauchn. tr. mother. IU. NPK 16-27.03.2009. T.4. Ukraine, Odessa: Black Sea 2009. P. 25-28.
  12. Andreeva V.V., Piganov M.N., Skomorohov G.Y.
  13. Individual forecasting precision thin-film capacitors stability // Microminiaturization radiotronic devices: Hi. Sat
  14. Ryazan RRTI, 1980. Issue 3. Р. 72-76. (In Russ.)
  15. Andreeva V.V., Piganov M.N., Belya-kov A.I.
  16. Individual forecasting extrapolating stability thin film resistors // Microminiaturization electronic devices: Hi. Sat
  17. Ryazan RRTI, 1981. Issue 4.
  18. Р. 123-127. (In Russ.)
  19. Tyulevin S.V., Piganov M.N.
  20. Teaching experiment methodology for individual prediction of quality space RES // Actual problems of padioelektroniki and Telecommunications: All-Russian materials STC 13-15 May 2008. Samara. Samara State Aerospace University Publishing House, 2008. Р. 239-253. (In Russ.)
  21. Piganov M.N., Shopin G.P., Tyulevin S.V., Tokarev A.V.
  22. Ustroystvo dlya snyatiya fazochastotnoy harakteristiki usiliteley [Unit to remove the phase-frequency characteristics of amplifiers]. Pat. 2480775. RF IPC G1R27 / 28.; applicant and patentee: Samara State Aerospace University. № 2011128883/28; (appl. 12.07.2011, published. 27.04.2013. Bull. Number 12).

Statistics

Views

Abstract - 58

PDF (Russian) - 29

Article Metrics

Metrics Loading ...

PlumX

Dimensions

Refbacks

  • There are currently no refbacks.

Copyright (c) 2015 VESTNIK of the Samara State Aerospace University

This website uses cookies

You consent to our cookies if you continue to use our website.

About Cookies