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Device for the assessment of surface condition by friction gaging
- Authors: Kolpakov V.A.1, Kolpakov A.I.1, Ivliev N.A.1, Krichevsky S.V.1
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Affiliations:
- Samara State Aerospace University
- Issue: Vol 12, No 1 (2013)
- Pages: 222-229
- Section: ELECTRONICS, MEASURING EQUIPMENT, RADIO ENGINEERING AND COMMUNICATION
- URL: https://journals.ssau.ru/vestnik/article/view/141
- DOI: https://doi.org/10.18287/1998-6629-2013-0-1(39)-222-229
- ID: 141
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Abstract
A device for monitoring the concentration of organic impurity on the surface of dielectric substrates such as CT-50, BK-94, BK-100, C5-1 in the range from 10-7 to 10-10 g/cm is described in the paper. The block diagram and the schematic diagram of the device as well as the algorithm of its operation are presented. The structure makes it possible to replace a substrate (the sample under study and the probe) within 60-80 seconds.
About the authors
V. A. Kolpakov
Samara State Aerospace University
Author for correspondence.
Email: kolpakov@ssau.ru
Doctor of Physics and Mathematics
Associate Professor of the Technical Cybernetics Department
Russian FederationA. I. Kolpakov
Samara State Aerospace University
Email: akolpakov@yandex.ru
Candidate of Technical Science
Associate Professor of the Department of Electronic Systems and Devices
Russian FederationN. A. Ivliev
Samara State Aerospace University
Email: ivlievn@gmail.com
Postgraduate Student of the Technical Cybernetics Department
Russian FederationS. V. Krichevsky
Samara State Aerospace University
Email: mitrea@yandex.ru
Candidate of Technical Science
Associate Professor of the Department of Electronic Systems and Devices
Russian FederationReferences
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