Device for the assessment of surface condition by friction gaging

Abstract

A device for monitoring the concentration of organic impurity on the surface of dielectric substrates such as CT-50, BK-94, BK-100, C5-1 in the range from 10-7 to 10-10 g/cm is described in the paper. The block diagram and the schematic diagram of the device as well as the algorithm of its operation are presented. The structure makes it possible to replace a substrate (the sample under study and the probe) within 60-80 seconds.

About the authors

V. A. Kolpakov

Samara State Aerospace University

Author for correspondence.
Email: kolpakov@ssau.ru

Doctor of Physics and Mathematics

Associate Professor of the Technical Cybernetics Department

Russian Federation

A. I. Kolpakov

Samara State Aerospace University

Email: akolpakov@yandex.ru

Candidate of Technical Science

Associate Professor of the Department of Electronic Systems and Devices

Russian Federation

N. A. Ivliev

Samara State Aerospace University

Email: ivlievn@gmail.com

Postgraduate Student of the Technical Cybernetics Department

Russian Federation

S. V. Krichevsky

Samara State Aerospace University

Email: mitrea@yandex.ru

Candidate of Technical Science

Associate Professor of the Department of Electronic Systems and Devices

Russian Federation

References

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