Forecasting technique of semiconductor diodes quality indicators

Козлова И. Н.; I. N. Kozlova; Тюлевин С. В.; S. V. Tyulevin; Токарева А. В.; A. V. Tokareva

doi:10.18287/2541-7533-2011-0-7(31)-87-91

Forecasting technique of semiconductor diodes quality indicators

Authors: Kozlova I.N.¹, Tyulevin S.V.¹, Tokareva A.V.¹
Affiliations:
1. Samara State Aerospace University
Issue: Vol 10, No 7 (2011)
Pages: 87-91
Section: ISSUE WITHOUT SECTION
URL: https://journals.ssau.ru/vestnik/article/view/2961
DOI: https://doi.org/10.18287/2541-7533-2011-0-7(31)-87-91
ID: 2961

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Abstract

Researchers have considered semiconductor devices individual forecasting technique by an extrapolation is resulted. The quasidetermined models choice questions. The method of the least squares is used for models parameters definition. The diodes reliability forecasting model is received. Use results and the model analysis are resulted. Variants of forecasting accuracy increase are offered.